|
|
|
|
Vol |
Jahr |
No. |
Seiten |
|
|
|
| T. Dahmen |
N. de Jonge, P. Trampert, M. Engstler, C. Pauly, F. Mücklich, P. Slusallek |
„"Smart Microscopy" Feature based adaptive ampling for Forcused Ion Beam Scanning Electron Microscopy“ |
Microscopy and Microanalysis |
22 |
2016 |
|
632 |
|
published |
|
| F. Mücklich |
J. Webel, H. Aboulfadl, N. Lindow, H.-C. Hege |
„Correlative Tomography - Extraction of Reliable Information with Adequate Resolution from mm Scale Down to Sub-nm Scale“ |
Microscopy and Microanalysis |
20 |
2014 |
|
838-839 |
DOI: http://dx.doi.org/10.1017/S1431927614005911 |
published |
|
| D. Britz |
A. Hegetschweiler, F. Mücklich |
„Opening the door to fundamental understanding of structure and color metallography - A correlative Microscopy Study on Steel“ |
Microscopy and Microanalysis |
20 |
2014 |
|
834-835 |
|
published |
|
| J. Balach |
F. Soldera, D. F. Acevedo, F. Mücklich, C. A. Barbero |
„A Direct and Quantitative Three-Dimensional Reconstruction of the Internal Structure of Disordered Mesoporous Carbon with Tailored Pore Size“ |
Microscopy and Microanalysis |
19 |
2013 |
|
745-750 |
DOI: 10.1017/S1431927613000238 | PDF verfügbar |
published |
|
| F. Mücklich |
M. Engstler |
„Microstructure Tomography in the Micro, Nano and Atomic scale – Advanced Access to Understand Local Formation as well as Degradation of Materials Microstructure“ |
Microscopy and Microanalysis |
16 |
2010 |
2 |
688-689 |
DOI: 10.1017/S1431927610063154 | PDF verfügbar |
published |
|
| A. Koblischka-Veneva |
M. R. Koblischka, S. Murphy, S. K. Arora, F. Mücklich, U. Hartmann, I. V. Shvets |
„Misorientations in [0 0 1] Magnetite Thin Films Studied by Electron Backscatter Diffraction“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
362-363 |
presented at MC2007, 2.-7.9.2007, Saarbrücken, Germany |
published |
|
| A. Koblischka-Veneva |
M. R. Koblischka, N. Hari Babu, D. A. Cardwell, F. Mücklich |
„EBSD-Analysis of Nanoparticles Embedded in High-Tc Superconductors“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
360-361 |
presented at MC2007. 2.-7..9.2007, Saarbrücken, Germany |
published |
|
| M. R. Koblischka |
A. Koblischka-Veneva, P. Das, T. Wolf, F. Mücklich, U. Hartmann |
„Nanostripes in (Nd,Eu,Gd)Ba2Cu3Ox (NEG) Single Crystals“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
356-357 |
presented at MC2007, 2.-7.9.2007, Saarbrücken, Germany |
published |
|
| F. Soldera |
Y. Gaillard, M. Anglada Gomila, F. Mücklich |
„FIB-Tomography of Nanoindentation Cracks in Zirconia Polycrystals“ |
Microscopy and Microanalysis |
13 |
2007 |
2 |
1510-1511 |
DOI: 10.1017/S1431927607075654 | PDF verfügbar |
published |
|
| C. Holzapfel |
F. Soldera, F. Mücklich |
„Answering Questions in Materials Science using FIB/SEM Dual Beam Methods“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
86-87 |
DOI : 10.1017/S1431927607080439 | PDF verfügbar |
published |
|
| S. Getlawi |
M. R. Koblischka, F. Soldera, U. Hartmann |
„Structuring of Permalloy by means of Electron-beam Lithography and Focused Ion Beam Milling“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
358-359 |
DOI: 10.1017/S1431927607081792 | PDF verfügbar |
published |
|
| F. Soldera |
N. Jeanvoine, K. Trinh, F. Mücklich |
„Investigation of the Structure of Plasma Erosions Craters using a SEM/FIB Dual Beam Workstation“ |
Microscopy and Microanalysis |
13 |
2007 |
3 |
422-423 |
DOI: 10.1017/S1431927607082116 | PDF verfügbar |
published |
|
