Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| T. Dahmen | N. de Jonge, P. Trampert, M. Engstler, C. Pauly, F. Mücklich, P. Slusallek | „"Smart Microscopy" Feature based adaptive ampling for Forcused Ion Beam Scanning Electron Microscopy“ | Microscopy and Microanalysis | 22 | 2016 | 632 | published |
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