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aktuelle Anzeige: Publications (peer-review), Eingrenzung: Co-Autor, Sortierung nach: Zeitschrift - view full database
T. Dahmen M. Engstler, C. Pauly, P. Trampert, N. de Jonge, F. Mücklich, P. Slusallek „Feature Adaptive Sampling for Scanning Electron Microscopy“ Scientific Reports Nature Publishing Group   2016     DOI: 10.1038/srep25350 published formated output
T. Dahmen N. de Jonge, P. Trampert, M. Engstler, C. Pauly, F. Mücklich, P. Slusallek „"Smart Microscopy" Feature based adaptive ampling for Forcused Ion Beam Scanning Electron Microscopy“ Microscopy and Microanalysis 22 2016   632   published formated output
J. Barrirero M. Engstler, N. Ghafoor, N. de Jonge, M. Odén, F. Mücklich „Comparison of segregations formed in unmodified and Sr-modified Al-Si alloys studied by atom probe tomography and transmission electron microscopy“ Journal of Alloys and Compounds 611 2014   410-421 DOI: 10.1016/j.jallcom.2014.05.121 published formated output

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