Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| A. Velichko | F. Mücklich | „Microstructure Tomography – An Essential Tool to Understand 3D Microstructures and Degradation Effects“ | Advances in Solid State Physics | 48 | 2009 | 331-342 | DOI: 10.1007/978-3-540-85859-1_26 | published |
|
