Stand: 21.6.2021, 15:37
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Seiten |
Status |
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A. Velichko | F. Mücklich | „3D-Analysis of Complex Microstructures. Quantification and Classification by FIB/SEM-Nanotomography“ | G.I.T. Imaging & Microscopy | 3 | 2007 | 40-42 | published |