Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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A. Velichko | F. Mücklich | „Microstructure Tomography – An Essential Tool to Understand 3D Microstructures and Degradation Effects“ | Advances in Solid State Physics | 48 | 2009 | 331-342 | DOI 10.1007/978-3-540-85859-1; ISBN 978-3-540-85858-4 | published |
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M. Engstler | A. Velichko, F. Klöpper, F. Mücklich | „Automated FIB-EDS-Nanotomography and its Application to Sr-Modified Al-Si Foundry Alloys“ | Aluminium Alloys - Their Physical and Mechanical Properties-Volume 1 | 2008 | 795-800 | Edited by Jürgen Hirsch, Birgit Strotzki and Günter Gottstein, Wiley VCH ISBN 978-3-527-32367-8 | PDF verfügbar | published |
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