Stand: 21.6.2021, 15:37
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Autor |
Vol |
No. |
Seiten |
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F. Soldera | F. A. Lasagni, F. Mücklich | „Nano Characterization of Structures by Focused Ion Beam (FIB) Tomography“ | Fabrication and Characterization in the Micro-Nano Range: New Trends for Two and Three Dimensional Structures | 2011 | 171-199 | Editors: F. A. Lasagni, A. F. Lasagni (Eds), Springer-Verlag, Berlin Heidelberg, ISBN 978-3-642-17781-1 | PDF verfügbar | published |