Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Zeitschrift |
Vol |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| F. Mücklich | H. Oettel | „Measurement of Harmonic Reflections - An X-ray Method for Real Structure Analysis of Semiconducting Compounds“ | Physica Status Solidi A | 129 | 1992 | 323-335 | published |
|
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| I. C. Schramm | C. Pauly, M.P. Johansson Joesaar, P. Eklund, J. Schmauch, F. Mücklich, M. Odén | „Solid state formation of Ti4AlN3 in cathodic arc deposited (Ti1−xAlx)Ny alloys“ | Acta Materialia | 129 | 2017 | 268-277 | published |
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