Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| N. Jeanvoine | A. Velichko, C. Selzner, F. Mücklich | „Nanotomography of Electrical Contacts – New Insights by High Resolution 3D Analysis of Local Material Degradation“ | European Physical Journal: Applied Physics | 49 | 2008 | 255 | 1-6 | DOI: 10.1051/epjap/2009210 | PDF verfügbar | published |
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