Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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T. Dahmen | M. Engstler, C. Pauly, P. Trampert, N. de Jonge, F. Mücklich, P. Slusallek | „Feature Adaptive Sampling for Scanning Electron Microscopy“ | Scientific Reports Nature Publishing Group | 2016 | DOI: 10.1038/srep25350 | published |
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T. Dahmen | N. de Jonge, P. Trampert, M. Engstler, C. Pauly, F. Mücklich, P. Slusallek | „"Smart Microscopy" Feature based adaptive ampling for Forcused Ion Beam Scanning Electron Microscopy“ | Microscopy and Microanalysis | 22 | 2016 | 632 | published |
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J. Barrirero | M. Engstler, N. Ghafoor, N. de Jonge, M. Odén, F. Mücklich | „Comparison of segregations formed in unmodified and Sr-modified Al-Si alloys studied by atom probe tomography and transmission electron microscopy“ | Journal of Alloys and Compounds | 611 | 2014 | 410-421 | DOI: 10.1016/j.jallcom.2014.05.121 | published |
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