Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
No. |
Seiten |
Info |
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| H. Aboulfadl | I. Gallino, R. Busch, F. Mücklich | „Atomic scale analysis of phase formation and diffusion kinetics in AG/Al multilayer thin films“ | Applied Physics | 120 | 2016 | pp. 195306 | doi:10.1063/1.4968013 | published |
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