Stand: 21.6.2021, 15:37
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Vol |
No. |
Seiten |
Status |
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F. Mücklich | H. Oettel | „Measurement of Harmonic Reflections - An X-ray Method for Real Structure Analysis of Semiconducting Compounds“ | Physica Status Solidi A | 129 | 1992 | 323-335 | published |