Stand: 21.6.2021, 15:37
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Autor |
Vol |
No. |
Seiten |
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F. Mücklich | A. Velichko, N. Jeanvoine, C. Selzner | „Nanotomography for Electrical Contacts -- New Insights by High Resolution 3D Analysis of Local Material Degradation“ | Proceedings of the 24th International Conference on Electrical Contacts | 2008 | 31-36 | ICEC Saint-Malo | published |